Normal view MARC view ISBD view

Digital holography for MEMS and microsystem metrology

Asundi Anand

Digital holography for MEMS and microsystem metrology Anand Asundi - John Wiley c2011 - xxii,205p

ISBN: 9780470978696

Dewey Class. No.: 621.375.6:778.38 ASU

Place hold
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com)